Przejdź do zawartości
Merck

773972

Sigma-Aldrich

Yttrium sputtering target

diam. × thickness 2.00 in. × 0.25 in., 99.9% trace metals basis

Synonim(y):

Yttrium

Zaloguj sięWyświetlanie cen organizacyjnych i kontraktowych


About This Item

Wzór empiryczny (zapis Hilla):
Y
Numer CAS:
Masa cząsteczkowa:
88.91
Numer WE:
Numer MDL:
Kod UNSPSC:
12352103
Identyfikator substancji w PubChem:
NACRES:
NA.23

Poziom jakości

Próba

99.9% trace metals basis

Postać

solid

przydatność reakcji

core: yttrium

rezystywność

57 μΩ-cm, 20°C

śr. × grubość

2.00 in. × 0.25 in.

tw

3338 °C (lit.)

mp

1522 °C (lit.)

gęstość

4.469 g/mL at 25 °C (lit.)

ciąg SMILES

[Y]

InChI

1S/Y

Klucz InChI

VWQVUPCCIRVNHF-UHFFFAOYSA-N

Szukasz podobnych produktów? Odwiedź Przewodnik dotyczący porównywania produktów

Zastosowanie

Solid Oxide Fuel cells operating at temperatures below 800 C (also known as intermediate temperature solid oxide fuel cell, IT-SOFC) are currently the topic of much research and development owing to the high degradation rates and materials costs incurred for SOFC operating at temperatures above 900 C. Thin films of electrode and electrolyte layers is one of the ways to achieve high performances in IT-SOFC.
Yttrium sputtering target can be used for physical vapor deposition of thin films of yttria stabilized zirconia layers for IT-SOFC. Yttrium containing thin films also find applications as thermal barrier and protective coatings, example in thermoelectric devices.
This page may contain text that has been machine translated.

Kod klasy składowania

11 - Combustible Solids

Klasa zagrożenia wodnego (WGK)

WGK 3

Temperatura zapłonu (°F)

Not applicable

Temperatura zapłonu (°C)

Not applicable


Wybierz jedną z najnowszych wersji:

Certyfikaty analizy (CoA)

Lot/Batch Number

Nie widzisz odpowiedniej wersji?

Jeśli potrzebujesz konkretnej wersji, możesz wyszukać konkretny certyfikat według numeru partii lub serii.

Masz już ten produkt?

Dokumenty związane z niedawno zakupionymi produktami zostały zamieszczone w Bibliotece dokumentów.

Odwiedź Bibliotekę dokumentów

S Blanco-Canosa et al.
Physical review letters, 110(18), 187001-187001 (2013-05-21)
We use resonant x-ray scattering to determine the momentum-dependent charge correlations in YBa(2)Cu(3) O(6.55) samples with highly ordered chain arrays of oxygen acceptors (ortho-II structure). The results reveal nearly critical, biaxial charge density wave (CDW) correlations at in-plane wave vectors
Yttrium-catalyzed addition of benzylic C-H bonds of alkyl pyridines to olefins.
Bing-Tao Guan et al.
Angewandte Chemie (International ed. in English), 52(16), 4418-4421 (2013-03-21)
Masahiko Ooe et al.
Aesthetic plastic surgery, 37(2), 424-433 (2013-02-12)
Skin wrinkles are one of the most cosmetically concerning signs of aging for women, and improvements in the visual effect of wrinkles become a matter of concern that has an impact on the quality of life. Although various wrinkle treatments
José Renato Queiroz et al.
The journal of adhesive dentistry, 15(2), 151-159 (2013-03-28)
To compare the effect of silica (Si)-based nano-coating deposited by reactive magnetron sputtering (RMP) with that of conventional surface conditioning using metal/zirconia primer alone or after air-particle abrasion on the adhesion of resin cements to zirconia ceramic. Two hundred forty
Gitanjal Deka et al.
Journal of biomedical optics, 19(1), 011012-011012 (2013-08-21)
Cellular micropattering has been increasingly adopted in quantitative biological experiments. A Q-switched pulsed neodymium-doped yttrium ortho-vanadate (Nd∶YVO4) laser directed in-situ microfabrication technique for cell patterning is presented. A platform is designed uniquely to achieve laser ablation. The platform is comprised

Produkty

Nanocomposite Coatings with Tunable Properties Prepared by Atomic Layer Deposition

Spin-based electronic (spintronic) devices offer significant improvement to the limits of conventional charge-based memory and logic devices which suffer from high power usage, leakage current, performance saturation, and device complexity.

The properties of many devices are limited by the intrinsic properties of the materials that compose them.

Nasz zespół naukowców ma doświadczenie we wszystkich obszarach badań, w tym w naukach przyrodniczych, materiałoznawstwie, syntezie chemicznej, chromatografii, analityce i wielu innych dziedzinach.

Skontaktuj się z zespołem ds. pomocy technicznej