NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• Kod UNSPSC: 41116107
• NACRES: NA.24

Właściwości

• klasa czystości: certified reference material
• Poziom jakości: 100
• Postać: solid
• opakowanie: pkg of 1 block
• producent / nazwa handlowa: NIST^®
• metody: diffraction/scattering: suitable
• Zastosowanie: general analytical

Opis

Opis ogólny

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

Zastosowanie

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

Cechy i korzyści

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

Inne uwagi

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

Informacje prawne

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

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Informacja o środkach bezpieczeństwa

• Kod klasy składowania: 10 - Combustible liquids
• Klasa zagrożenia wodnego (WGK): WGK 3
• Temperatura zapłonu (°F): Not applicable
• Temperatura zapłonu (°C): Not applicable