NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• Código UNSPSC: 41116107
• NACRES: NA.24

Propriedades

• grau: certified reference material
• Nível de qualidade: 100
• Formulário: solid
• embalagem: pkg of 1 block
• fabricante/nome comercial: NIST^®
• técnica(s): diffraction/scattering: suitable
• aplicação(ões): general analytical

Descrição

Descrição geral

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

Aplicação

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

Características e benefícios

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

Outras notas

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

Informações legais

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

Informações de segurança

• Código de classe de armazenamento: 11 - Combustible Solids
• Classe de risco de água (WGK): nwg
• Ponto de fulgor (°F): Not applicable
• Ponto de fulgor (°C): Not applicable