NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• UNSPSCコード: 41116107
• NACRES: NA.24

特性

• グレード: certified reference material
• 品質水準: 100
• 形状: solid
• 包装: pkg of 1 block
• メーカー／製品名: NIST^®
• テクニック: diffraction/scattering: suitable
• アプリケーション: general analytical

詳細

詳細

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

アプリケーション

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

特徴および利点

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

その他情報

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

法的情報

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

安全性情報

• 保管分類コード: 11 - Combustible Solids
• WGK: nwg
• 引火点(°F): Not applicable
• 引火点(℃): Not applicable