NISTRM8820
Scanning electron microscope scale calibration artifact
NIST® RM 8820
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About This Item
UNSPSC Code:
41116107
NACRES:
NA.24
Recommended Products
grade
certified reference material
Quality Level
form
chips
manufacturer/tradename
NIST®
technique(s)
electron microscopy: suitable
application(s)
semiconductor
General description
Other Notes
Example analytes are listed below as a reference. Please download a current certificate at nist.gov/SRM for current analytes and certified values.
Silicon (Si)
See certificate for values and more details at nist.gov/SRM.
Silicon (Si)
See certificate for values and more details at nist.gov/SRM.
Legal Information
NIST is a registered trademark of National Institute of Standards and Technology
Storage Class
13 - Non Combustible Solids
wgk_germany
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
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