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Key Documents
GF86468754
Tantalum
foil, 0.1m coil, thickness 0.03mm, coil width 1.2mm, annealed, 99.9%
Synonim(y):
Tantalum, TA000354, Ta
Zaloguj sięWyświetlanie cen organizacyjnych i kontraktowych
About This Item
ciśnienie pary
<0.01 mmHg ( 537.2 °C)
Próba
≥99.9%
Postać
foil
temp. samozapłonu
572 °F
producent / nazwa handlowa
Goodfellow 864-687-54
rezystywność
13.5 μΩ-cm, 20°C
tw
5425 °C (lit.)
mp
2996 °C (lit.)
gęstość
16.69 g/cm3 (lit.)
ciąg SMILES
[Ta]
InChI
1S/Ta
Klucz InChI
GUVRBAGPIYLISA-UHFFFAOYSA-N
Opis ogólny
For updated SDS information please visit www.goodfellow.com.
Informacje prawne
Product of Goodfellow
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Dokumenty związane z niedawno zakupionymi produktami zostały zamieszczone w Bibliotece dokumentów.
Journal of hazardous materials, 225-226, 21-27 (2012-05-23)
In order to overcome the limitation of the application of nanoparticles, tantalum (oxy)nitrides nanotube arrays on a Ta foil were synthesized and introduced in vis (visible light)-Fenton-like system to enhance the degradation of atrazine. At first, the anodization of tantalum
The journal of physical chemistry. B, 109(10), 4796-4800 (2006-07-21)
Both monolayer and thick (20 microm) films of dry pGEM-3Zf(-) plasmid DNA deposited on tantalum foil were exposed to Al Kalpha X-rays (1.5 keV) for various times in an ultrahigh vacuum chamber. For monolayer DNA, the damage was induced mainly
Talanta, 31(12), 1053-1056 (1984-12-01)
A 40-fold increase in sensitivity obtained by using a tantalum foil lining in a pyrolytically-coated graphite furnace permitted determination of low ppm levels of cerium in most silicate rocks. A preliminary preconcentration by oxalate and hydroxide co-precipitations was used before
Radiation research, 165(3), 365-371 (2006-02-24)
Both thick and thin films of pGEMR-3Zf- plasmid DNA deposited on a tantalum foil were exposed to soft X rays (effective energy of 14.8 keV) for various times in air under a relative humidity of 45% (Gamma approximately 6, where
Talanta, 32(1), 1-6 (1985-01-01)
An improved graphite furnace atomic-absorption method has been developed for the determination of Sc, Y and the rare-earth elements in silicate rocks and related materials. The method, which involves the separation of the lanthanides by ion-exchange followed by their determination
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