NIST2135C

Ni/Cr thin film depth profile standard

NIST SRM 2135c

• UNSPSCコード: 41116107
• NACRES: NA.24

特性

• グレード: certified reference material
• 品質水準: 100
• 形状: solid
• 包装: pkg of each
• メーカー／製品名: NIST^®
• テクニック: XRF: suitable
• アプリケーション: environmental

詳細

詳細

Each unit of Ni/Cr thin film depth profile standard (SRM) contains nine alternating metal thin-film layers, including five layers of pure chromium and four of pure nickel, on a polished silicon (100) substrate. These layers have nominal thicknesses of 57 nm for Cr and 56 nm for Ni. The area of the specimen is certified and determined by the full width of the substrate (1.0 cm) and a length of 2.0 cm, centered on the 2.54 cm length of the substrate. For more information, please refer to the COA and SDS.
SRM 2135C_cert
SRM 2135C_SDS

アプリケーション

Standard Reference Material NIST2135C is intended for use in the calibration of sputtered depth scales and erosion rates in surface analysis. Its periodic structure, containing eight well-defined metal/metal interfaces, allows for precise calibration at various depths.

特徴および利点

• The total certified thickness for Chromium (Cr) and Nickel (Ni) single element layer-to-layer uniformity, bilayer uniformity (periodicity) and single layer thickness are expressed in units of mass/area and determined by XRF and ICP using a gravimetrically calibrated reference.
• Expiration details and instructions for use, storage and handling are provided on the NIST certificate.

その他情報

Example analytes are listed below as a reference. Please download a current certificate at nist.gov/SRM for current analytes and certified values.
Nickel (Ni), Chromium (Cr)

See certificate for values and more details at nist.gov/SRM.

法的情報

NIST is a registered trademark of National Institute of Standards and Technology

安全性情報

• 保管分類コード: 11 - Combustible Solids
• WGK: WGK 3
• 引火点(°F): Not applicable
• 引火点(℃): Not applicable