推荐产品
化驗
99.9%
形狀
foil
製造商／商標名
Goodfellow 112-863-45
電阻係數
5.0 μΩ-cm, 20°C
長度 × 寬度 × 厚度
300 mm × 300 mm × 0.25 mm
bp
4612 °C (lit.)
mp
2617 °C (lit.)
密度
10.3 g/mL at 25 °C (lit.)
SMILES 字串
[Mo]
InChI
1S/Mo
InChI 密鑰
ZOKXTWBITQBERF-UHFFFAOYSA-N
一般說明
For updated SDS information please visit www.goodfellow.com.
法律資訊
Product of Goodfellow
P Kielczynski et al.
IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 46(1), 233-238 (2008-02-02)
In this paper the theoretical analysis and the results of testing of a piezoelectric cantilever for the investigation of material surfaces are presented. The cantilever consists of a thin piezoelectric plate bonded with a thin metal (e.g., molybdenum) foil. The
Charles F Baker et al.
Dalton transactions (Cambridge, England : 2003), (9)(9), 1298-1303 (2004-07-15)
New molybdenum(VI) nitride oxides were synthesised by the reaction of strontium nitride and calcium nitride with molybdenum foil at high temperature in sealed stainless steel crucibles. The reactions yielded single crystalline products determined by X-ray diffraction to form complex structures
J G Watkins et al.
The Review of scientific instruments, 79(10), 10F125-10F125 (2008-12-03)
Two modular arrays of Langmuir probes designed to handle a heat flux of up to 25 MW/m(2) for 10 s exposures have been installed in the lower divertor target plates of the DIII-D tokamak. The 20 pyrolytic graphite probe tips
Michael N Evans
Rapid communications in mass spectrometry : RCM, 22(14), 2211-2219 (2008-06-11)
A reactor for converting cellulose into carbon monoxide for subsequent oxygen isotopic analysis via continuous flow isotope ratio mass spectrometry is described. The system employs an induction heater to produce temperatures >or=1500 degrees C within a molybdenum foil crucible positioned
Dattatray J Late et al.
Nanotechnology, 19(26), 265605-265605 (2008-07-02)
Nanocrystalline lanthanum hexaboride (LaB(6)) films have been deposited on molybdenum foil by the pulsed laser deposition (PLD) technique. The as-deposited films were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The XRD pattern shows
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