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Merck
모든 사진(1)

문서

15747

Supelco

Silicon Standard for ICP

TraceCERT®, 1 g/L Si in NaOH (nominal concentration)

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About This Item

UNSPSC 코드:
41116107
NACRES:
NA.24

Grade

certified reference material

Quality Level

제품 라인

TraceCERT®

grade

TraceCERT®

농도

1 g/L Si in NaOH (nominal concentration)

기술

ICP: suitable

응용 분야

industrial qc
pharmaceutical

형식

single component solution

일반 설명

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

애플리케이션

50 ng/g of Silicon standard may be used to improve maximum signal-to-background intensity ratios (SBR) during High-resolution inductively coupled plasma mass spectrometry (HR-ICP-MS).

분석 메모

1 g/L Si in 2% sodium hydroxide, prepared with high purity Si, NaOH and water

기타 정보

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website

법적 정보

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

픽토그램

Corrosion

신호어

Danger

유해 및 위험 성명서

Hazard Classifications

Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B

Storage Class Code

8B - Non-combustible corrosive hazardous materials

WGK

nwg

Flash Point (°F)

Not applicable

Flash Point (°C)

Not applicable

개인 보호 장비

Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter


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시험 성적서(COA)

Lot/Batch Number

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문서 라이브러리 방문

Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS.
Pohl, Pawel, et al.
Journal of Analytical Atomic Spectrometry, 25.9, 1461-1466 (2010)

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