634867

Silicon dioxide

single crystal substrate, optical grade, 99.99% trace metals basis, L × W × thickness 10 mm × 10 mm × 0.5 mm

• Sinônimo(s): Cristobalite, Quartz, Sand, Silica
• Fórmula linear: SiO₂
• Número CAS: 60676-86-0
• Peso molecular: 60.08
• Número CE: 262-373-8
• Número MDL: MFCD00011232
• Código UNSPSC: 12352303
• ID de substância PubChem: 24882697
• NACRES: NA.23

Propriedades

• grau: optical grade
• Ensaio: 99.99% trace metals basis
• forma: solid
• dureza: 7.0 mohs
• C × L × espessura: 10 mm × 10 mm × 0.5 mm
• índice de refração: n20/D 1.544 (lit.)
• pf: 1610 °C (lit.)
• temperatura de transição: T_m 573.1 °C (phase change)
• densidade: 2.6 g/mL at 25 °C (lit.); 2.684 g/mL
• cadeia de caracteres SMILES: O=[Si]=O
• InChI: 1S/O2Si/c1-3-2
• chave InChI: VYPSYNLAJGMNEJ-UHFFFAOYSA-N

Descrição

Aplicação

SiO₂ is majorly used as a substrate material with excellent thermo-mechanical properties in a variety of applications which include:

• vapour deposition
• phase deposition
• atomic force microscopy probes(AFM)
• spin coating
• electronic based devices

Características e benefícios

An excellent substrate for microwave filters for applications in the wireless communication arena.

forma física

Crystalline, hexagonal (a = 4.914 Å, c = 5.405 Å)

Outras notas

specific heat = 0.18 cal/g; thermoelectric constant = 1200μV/°C @ 300 °C; thermal conductivity = 0.0033 cal/cm°C; themal expansion (x10^-6) = α₁₁: 13.71, α₃₃: 7.48; Q value = 1.8 × 10⁶ min; acoustic velocity, SAW = 3160 m/sec; frequency constant, BAW = 1661 kHz/mm; piezoelectric coupling = K² BAW: 0.65%, SAW: 0.14%

Informações de segurança

• Código de classe de armazenamento: 13 - Non Combustible Solids
• Classe de risco de água (WGK): nwg
• Ponto de fulgor (°F): Not applicable
• Ponto de fulgor (°C): Not applicable
• Equipamento de proteção individual: dust mask type N95 (US), Eyeshields, Gloves