634867

Silicon dioxide

single crystal substrate, optical grade, 99.99% trace metals basis, L × W × thickness 10 mm × 10 mm × 0.5 mm

• Synonym(s): Cristobalite, Quartz, Sand, Silica
• Linear Formula: SiO₂
• CAS Number: 60676-86-0
• Molecular Weight: 60.08
• EC Number: 262-373-8
• MDL number: MFCD00011232
• UNSPSC Code: 12352303
• PubChem Substance ID: 24882697
• NACRES: NA.23

Properties

• grade: optical grade
• Quality Level: 100
• Assay: 99.99% trace metals basis
• form: solid
• hardness: 7.0 mohs
• L × W × thickness: 10 mm × 10 mm × 0.5 mm
• refractive index: n20/D 1.544 (lit.)
• mp: 1610 °C (lit.)
• transition temp: T_m 573.1 °C (phase change)
• density: 2.6 g/mL at 25 °C (lit.); 2.684 g/mL
• SMILES string: O=[Si]=O
• InChI: 1S/O2Si/c1-3-2
• InChI key: VYPSYNLAJGMNEJ-UHFFFAOYSA-N

Description

Application

SiO₂ is majorly used as a substrate material with excellent thermo-mechanical properties in a variety of applications which include:

• vapour deposition
• phase deposition
• atomic force microscopy probes(AFM)
• spin coating
• electronic based devices

Features and Benefits

An excellent substrate for microwave filters for applications in the wireless communication arena.

Physical form

Crystalline, hexagonal (a = 4.914 Å, c = 5.405 Å)

Other Notes

specific heat = 0.18 cal/g; thermoelectric constant = 1200μV/°C @ 300 °C; thermal conductivity = 0.0033 cal/cm°C; themal expansion (x10^-6) = α₁₁: 13.71, α₃₃: 7.48; Q value = 1.8 × 10⁶ min; acoustic velocity, SAW = 3160 m/sec; frequency constant, BAW = 1661 kHz/mm; piezoelectric coupling = K² BAW: 0.65%, SAW: 0.14%

Safety Information

• Storage Class Code: 13 - Non Combustible Solids
• WGK: nwg
• Flash Point(F): Not applicable
• Flash Point(C): Not applicable
• Personal Protective Equipment: dust mask type N95 (US), Eyeshields, Gloves