NIST2000

高分辨率X射线衍射用校准标准品

NIST^® SRM^® 2000

• 分類程式碼代碼: 41116107
• NACRES: NA.24

屬性

• 等級: certified reference material
• 品質等級: 100
• 形狀: solid
• 包裝: pkg of 1 block
• 製造商／商標名: NIST^®
• 技術: diffraction/scattering: suitable
• 應用: general analytical

描述

一般說明

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

應用

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

特點和優勢

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

其他說明

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

法律資訊

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

安全資訊

• 儲存類別代碼: 11 - Combustible Solids
• 水污染物質分類（WGK）: nwg
• 閃點（°F）: Not applicable
• 閃點（°C）: Not applicable