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應用
This holder is designed to hold thin samples vertically in the SEM or any microscope. It is 25 mm in diameter and 10 mm thick. Each of the two loader jaws can hold up to 3 mm thick samples. The spring loader keeps thin samples vertical so that cross sections can be studied. This holder is very useful for cross sections of silicon wafers or multilayer capacitors.
This holder can be adapted to any adapter pin listed above to accommodate your instrument.
This holder can be adapted to any adapter pin listed above to accommodate your instrument.
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