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Merck

GF41894062

foil, 10mm disks, thickness 0.05mm, as rolled, 100%

别名:

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About This Item

经验公式(希尔记法):
In
CAS号:
分子量:
114.82
MDL號碼:
分類程式碼代碼:
12141719
PubChem物質ID:
NACRES:
NA.23

蒸汽壓力

<0.01 mmHg ( 25 °C)

化驗

100%

形狀

foil

製造商/商標名

Goodfellow 418-940-62

電阻係數

8.37 μΩ-cm

直徑× 厚度

10 mm × 0.05 mm

mp

156.6 °C (lit.)

密度

7.3 g/mL at 25 °C (lit.)

SMILES 字串

[In]

InChI

1S/In

InChI 密鑰

APFVFJFRJDLVQX-UHFFFAOYSA-N

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一般說明

For updated SDS information please visit www.goodfellow.com.

法律資訊

Product of Goodfellow

象形圖

Environment

危險聲明

防範說明

危險分類

Aquatic Chronic 2

儲存類別代碼

13 - Non Combustible Solids

水污染物質分類(WGK)

WGK 3

閃點(°F)

Not applicable

閃點(°C)

Not applicable


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分析证书(COA)

Lot/Batch Number

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Evaluation of the repair of mechanical furcation perforations using amalgam, gutta-percha, or indium foil.
R Aguirre et al.
Journal of endodontics, 12(6), 249-256 (1986-06-01)
Yuri Alexandre Aoto et al.
The Journal of chemical physics, 134(10), 104303-104303 (2011-03-17)
The doubly positively charged gas-phase molecules BrO(2+) and NBr(2+) have been produced by prolonged high-current energetic oxygen (17 keV (16)O(-)) ion surface bombardment (ion beam sputtering) of rubidium bromide (RbBr) and of ammonium bromide (NH(4)Br) powdered ionic salt samples, respectively
Loïc Bertrand et al.
The Analyst, 138(16), 4463-4469 (2013-04-05)
In order to fully characterize the zinc white artists' pigment (ZnO), much used since the mid-nineteenth century, three samples collected in the early 20th century were studied using a combination of synchrotron and macroscopic photoluminescence spectroscopy and imaging. An improved
C Takada et al.
Radiation protection dosimetry, 144(1-4), 575-579 (2010-11-11)
At the Nuclear Fuel Cycle Engineering Laboratories of the Japan Atomic Energy Agency (JAEA), small pieces of indium foil incorporated into personal dosemeters have been used for personnel screening in criticality accidents. Irradiation tests of the badges were performed using
R J Schulz et al.
Medical physics, 4(1), 42-45 (1977-01-01)
A sensitive and relatively simple method for obtaining an index of the spectral quality of x rays in the 4-15-MV range is presented. The method is based upon the simultaneous production of 115mIn by inelastic scattering of x rays by

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