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Aluminum Standard for ICP

TraceCERT®, 1 g/L Al in nitric acid (nominal concentration)

Synonym(s):

ICP aluminum calibration standard

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About This Item

UNSPSC Code:
41116107
NACRES:
NA.24

grade

certified reference material
TraceCERT®

Quality Level

product line

TraceCERT®

concentration

1 g/L Al in nitric acid (nominal concentration)

technique(s)

ICP: suitable

application(s)

cleaning products
cosmetics
environmental
food and beverages
personal care

format

single component solution

General description

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

Application

Aluminum Standard for ICP can be used as a calibration standard in the determination of aluminum in aluminosilicates by inductively coupled plasma-optical emission spectroscopy (ICP-OES).

Analysis Note

1 g/L Al in 2% nitric acid, prepared with high purity Al(NO3)3·9H2O, HNO3, and water

Other Notes

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website

Legal Information

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

Pictograms

Corrosion

Signal Word

Danger

Hazard Statements

Hazard Classifications

Eye Dam. 1 - Met. Corr. 1 - Skin Irrit. 2

Storage Class Code

8B - Non-combustible corrosive hazardous materials

WGK

WGK 1

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

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Online determination of copper in aluminum alloy by microchip solvent extraction using isotope dilution ICP-MS method
Kagawa T, et al.
Talanta, 79(4), 1001-1005 (2009)

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