NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• UNSPSC 코드: 41116107
• NACRES: NA.24

속성

• Grade: certified reference material
• Quality Level: 100
• 형태: solid
• 포장: pkg of 1 block
• 제조업체/상표: NIST^®
• 기술: diffraction/scattering: suitable
• 응용 분야: general analytical

설명

일반 설명

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

애플리케이션

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

특징 및 장점

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

기타 정보

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

법적 정보

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

안전성 정보

• Storage Class Code: 11 - Combustible Solids
• WGK: nwg
• Flash Point (°F): Not applicable
• Flash Point (°C): Not applicable