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Supelco

Micro particles based on silicon dioxide

size: 5 μm

Synonym(s):

Silica dioxide microsphere (5 μm), Micro silicon (5 μm), Beads based on silicon dioxide, microsize, Silicon dioxide beads

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About This Item

MDL number:
MFCD00011232
UNSPSC Code:
41116107
PubChem Substance ID:
57650210
NACRES:
NA.25

grade

analytical standard

form

aqueous suspension

concentration

5% (solids)

particle size

5 μm std dev ≤0.35 μm

application(s)

glass & ceramic
industrial qc
pharmaceutical

format

neat

storage temp.

2-8°C

SMILES string

O=[Si]=O

InChI

1S/O2Si/c1-3-2

InChI key

VYPSYNLAJGMNEJ-UHFFFAOYSA-N

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General description

Silicon dioxide based microparticles are ideal to determine particle size distribution (PSD) profile of test samples.
The particle diameter of 5 μm is measured using Coulter Multisizer.

Application

Used for regular calibration and checking of particle size instruments. Also used:
  • to study transport properties of microscopic particles via heterogeneous media
  • as a test standard to validate denoising method used in optical diffraction tomography
  • in accelerated annealing experiments involving colloidal silica monolayers
  • to evaluate the measurement accuracy of color-coded LED microscopy (cLEDscope) technique
  • as a calibration standard in optical trapping system to measure surface mechanical properties

Features and Benefits

  • suitable for routine instrument calibration monitoring, testing and corrections
  • particle size traceable to Community Bureau of Reference (BCR) standards
  • available in 5 mL pack size as a neat sample

Storage Class Code

10 - Combustible liquids

WGK

WGK 2

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

Certificates of Analysis (COA)

Search for Certificates of Analysis (COA) by entering the products Lot/Batch Number. Lot and Batch Numbers can be found on a product’s label following the words ‘Lot’ or ‘Batch’.

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Chansuk Park et al.
Journal of the Optical Society of America. A, Optics, image science, and vision, 35(11), 1891-1898 (2018-11-22)
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Optics express, 23(13), 16933-16948 (2015-07-21)
In optical tomography, there exist certain spatial frequency components that cannot be measured due to the limited projection angles imposed by the numerical aperture of objective lenses. This limitation, often called as the missing cone problem, causes the under-estimation of
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