NISTRM8820
Scanning electron microscope scale calibration artifact
NIST® RM 8820
About This Item
Recommended Products
grade
certified reference material
Quality Level
form
chips
manufacturer/tradename
NIST®
technique(s)
electron microscopy: suitable
application(s)
semiconductor
General description
Other Notes
Silicon (Si)
See certificate for values and more details at nist.gov/SRM.
Legal Information
Storage Class Code
13 - Non Combustible Solids
WGK
WGK 3
Flash Point(F)
Not applicable
Flash Point(C)
Not applicable
Regulatory Listings
Regulatory Listings are mainly provided for chemical products. Only limited information can be provided here for non-chemical products. No entry means none of the components are listed. It is the user’s obligation to ensure the safe and legal use of the product.
ISHL Indicated Name
Substances Subject to be Indicated Names
ISHL Notified Names
Substances Subject to be Notified Names
JAN Code
NISTRM8820:
Choose from one of the most recent versions:
Certificates of Analysis (COA)
Sorry, we don't have COAs for this product available online at this time.
If you need assistance, please contact Customer Support.
Already Own This Product?
Find documentation for the products that you have recently purchased in the Document Library.
Our team of scientists has experience in all areas of research including Life Science, Material Science, Chemical Synthesis, Chromatography, Analytical and many others.
Contact Technical Service