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Key Documents

Safety Information

NISTRM8820

Scanning electron microscope scale calibration artifact

NIST® RM 8820

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About This Item

UNSPSC Code:
41116107
NACRES:
NA.24

grade

certified reference material

Quality Level

form

chips

manufacturer/tradename

NIST®

technique(s)

electron microscopy: suitable

application(s)

semiconductor

General description

Other Notes

Example analytes are listed below as a reference. Please download a current certificate at nist.gov/SRM for current analytes and certified values.
Silicon (Si)

See certificate for values and more details at nist.gov/SRM.

Legal Information

NIST is a registered trademark of National Institute of Standards and Technology

Storage Class Code

13 - Non Combustible Solids

WGK

WGK 3

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable


Regulatory Listings

Regulatory Listings are mainly provided for chemical products. Only limited information can be provided here for non-chemical products. No entry means none of the components are listed. It is the user’s obligation to ensure the safe and legal use of the product.

ISHL Indicated Name

Substances Subject to be Indicated Names

ISHL Notified Names

Substances Subject to be Notified Names

JAN Code

NISTRM8820:


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Certificates of Analysis (COA)

Lot/Batch Number

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