- Fast High-Resolution Screening Method for Reactive Surfaces by Combining Atomic Force Microscopy and Surface-Enhanced Raman Scattering.
Fast High-Resolution Screening Method for Reactive Surfaces by Combining Atomic Force Microscopy and Surface-Enhanced Raman Scattering.
Applied spectroscopy (2017-07-01)
Camiel H van Hoorn, Carlos Wessels, Freek Ariese, Arjan J G Mank
PMID28664782
摘要
A fast high-resolution screening method for reactive surfaces is presented. Atomic force microscopy (AFM) and surface-enhanced Raman spectroscopy (SERS) are combined in one method in order to be able to obtain both morphological and chemical information about processes at a surface. In order to accurately align the AFM and SERS images, an alignment pattern on the substrate material is exploited. Subsequent SERS scans with sub-micron resolution are recorded in 30 min per scan for an area of 100 × 100 µm
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