NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• Código UNSPSC: 41116107
• NACRES: NA.24

Propiedades

• grado: certified reference material
• Nivel de calidad: 100
• Formulario: solid
• envase: pkg of 1 block
• fabricante / nombre comercial: NIST^®
• técnicas: diffraction/scattering: suitable
• aplicaciones: general analytical

Descripción

Descripción general

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

Aplicación

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

Características y beneficios

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

Otras notas

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

Información legal

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

Información de seguridad

• Código de clase de almacenamiento: 11 - Combustible Solids
• Clase de riesgo para el agua (WGK): nwg
• Punto de inflamabilidad (°F): Not applicable
• Punto de inflamabilidad (°C): Not applicable