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16639

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Gallium Standard for ICP

TraceCERT®, 1 g/L Ga in nitric acid (nominal concentration)

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About This Item

UNSPSC Code:
41116107
NACRES:
NA.24

grade

certified reference material
TraceCERT®

Quality Level

product line

TraceCERT®

concentration

1 g/L Ga in nitric acid (nominal concentration)

technique(s)

ICP: suitable

format

single component solution

General description

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

Application

Gallium standard was used as internal standard for analyzing serum using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF) to determine the concentration of P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb elements.

Analysis Note

1 g/L Ga in 5% nitric acid, prepared with high purity Ga metal, HNO3, and water

Other Notes

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website

Legal Information

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

Pictograms

Corrosion

Signal Word

Danger

Hazard Statements

Hazard Classifications

Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B

Supplementary Hazards

Storage Class Code

8B - Non-combustible, corrosive hazardous materials

WGK

WGK 2

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

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C G L Canellas et al.
Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine, 70(7), 1277-1280 (2012-03-01)
In this work we analyzed serum samples from patients with Sickle Cell Anemia (SCA) using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF). The SRTXRF measurements were performed at the X-Ray Fluorescence Beamline at the Brazilian National Synchrotron Light Laboratory

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