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Merck

Molecular depth profiling by wedged crater beveling.

Analytical chemistry (2011-07-13)
Dan Mao, Caiyan Lu, Nicholas Winograd, Andreas Wucher
摘要

Time-of-flight secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by a 40-keV C(60)(+) cluster ion beam on an organic film of Irganox 1010 doped with Irganox 3114 delta layers. From an examination of the resulting surface, the information about depth resolution, topography, and erosion rate can be obtained as a function of crater depth for every depth in a single experiment. It is shown that when measurements are performed at liquid nitrogen temperature, a constant erosion rate and reduced bombardment induced surface roughness is observed. At room temperature, however, the erosion rate drops by ∼(1)/(3) during the removal of the 400 nm Irganox film and the roughness gradually increased to from 1 nm to ∼4 nm. From SIMS lateral images of the beveled crater and AFM topography results, depth resolution was further improved by employing glancing angles of incidence and lower primary ion beam energy. Sub-10 nm depth resolution was observed under the optimized conditions on a routine basis. In general, we show that the wedge-crater beveling is an important tool for elucidating the factors that are important for molecular depth profiling experiments.

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Sigma-Aldrich
季戊四醇四(3,5-二--丁基-4-羟基氢化肉桂酸酯), 98%
四(3,5-二叔丁基-4-羟基氢化肉桂酸)季戊四醇酯, European Pharmacopoeia (EP) Reference Standard