推薦產品
蒸汽壓力
<0.01 mmHg ( 25 °C)
化驗
≥99.8%
形狀
foil
製造商／商標名
Goodfellow 875-726-49
電阻係數
8.37 μΩ-cm
mp
156.6 °C (lit.)
密度
7.3 g/mL at 25 °C (lit.)
SMILES 字串
[In]
InChI
1S/In
InChI 密鑰
APFVFJFRJDLVQX-UHFFFAOYSA-N
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一般說明
For updated SDS information please visit www.goodfellow.com.
法律資訊
Product of Goodfellow
危險聲明
危險分類
Aquatic Chronic 2
儲存類別代碼
13 - Non Combustible Solids
水污染物質分類（WGK）
WGK 3
閃點（°F）
Not applicable
閃點（°C）
Not applicable
分析證明 (COA)
輸入產品批次/批號來搜索 分析證明 (COA)。在產品’s標籤上找到批次和批號，寫有 ‘Lot’或‘Batch’.。
Evaluation of the repair of mechanical furcation perforations using amalgam, gutta-percha, or indium foil.
R Aguirre et al.
Journal of endodontics, 12(6), 249-256 (1986-06-01)
Yuri Alexandre Aoto et al.
The Journal of chemical physics, 134(10), 104303-104303 (2011-03-17)
The doubly positively charged gas-phase molecules BrO(2+) and NBr(2+) have been produced by prolonged high-current energetic oxygen (17 keV (16)O(-)) ion surface bombardment (ion beam sputtering) of rubidium bromide (RbBr) and of ammonium bromide (NH(4)Br) powdered ionic salt samples, respectively
Loïc Bertrand et al.
The Analyst, 138(16), 4463-4469 (2013-04-05)
In order to fully characterize the zinc white artists' pigment (ZnO), much used since the mid-nineteenth century, three samples collected in the early 20th century were studied using a combination of synchrotron and macroscopic photoluminescence spectroscopy and imaging. An improved
C Takada et al.
Radiation protection dosimetry, 144(1-4), 575-579 (2010-11-11)
At the Nuclear Fuel Cycle Engineering Laboratories of the Japan Atomic Energy Agency (JAEA), small pieces of indium foil incorporated into personal dosemeters have been used for personnel screening in criticality accidents. Irradiation tests of the badges were performed using
R J Schulz et al.
Medical physics, 4(1), 42-45 (1977-01-01)
A sensitive and relatively simple method for obtaining an index of the spectral quality of x rays in the 4-15-MV range is presented. The method is based upon the simultaneous production of 115mIn by inelastic scattering of x rays by
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