16639
Gallium Standard for ICP
TraceCERT®, 1 g/L Ga in nitric acid (nominal concentration)
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About This Item
Recommended Products
grade
certified reference material
TraceCERT®
Quality Level
product line
TraceCERT®
concentration
1 g/L Ga in nitric acid (nominal concentration)
technique(s)
ICP: suitable
application(s)
industrial qc
pharmaceutical
format
single component solution
General description
This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.
Application
Gallium standard was used as internal standard for analyzing serum using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF) to determine the concentration of P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb elements.
Analysis Note
1 g/L Ga in 5% nitric acid, prepared with high purity Ga metal, HNO3, and water
Other Notes
For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website
Legal Information
TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany
Signal Word
Danger
Hazard Statements
Precautionary Statements
Hazard Classifications
Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B
Supplementary Hazards
Storage Class Code
8B - Non-combustible corrosive hazardous materials
WGK
WGK 2
Flash Point(F)
Not applicable
Flash Point(C)
Not applicable
Personal Protective Equipment
dust mask type N95 (US), Eyeshields, Gloves
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Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine, 70(7), 1277-1280 (2012-03-01)
In this work we analyzed serum samples from patients with Sickle Cell Anemia (SCA) using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF). The SRTXRF measurements were performed at the X-Ray Fluorescence Beamline at the Brazilian National Synchrotron Light Laboratory
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